• DocumentCode
    2922698
  • Title

    Technology-Model-Product Parallel Design for High Performance and Rapid Time to Market 65nm Technology-Generation Microprocessors

  • Author

    Logan, L.R. ; Greene, B.J. ; McStay, K. ; Liang, Q. ; Na, M.-H. ; Nowak, E. ; Ku, S.H. ; Friedrich, J. ; Clougherty, F. ; Dufrene, B. ; Zamdmer, N. ; Chidambarrao, D. ; Williams, R. ; McCullen, J. ; Slisher, D. ; Springer, S. ; Crabbé, E. ; Freeman, G.

  • Author_Institution
    IBM Syst. & Technol. Group, Hopewell Junction
  • fYear
    2007
  • fDate
    11-12 June 2007
  • Firstpage
    218
  • Lastpage
    222
  • Abstract
    Recently, 65 nm technology-based microprocessors have been introduced into high-end products such as games processors and high- performance servers [1]. As technology development in the modern-day relies more and more on non-traditional performance- leverage elements, there is an enhanced need to tighten the coupling between development, modeling, and design. We discuss the key challenges in the inter-related tasks of CMOS-technology development, early product engineering, and transition to full-volume manufacturing. In order to meet timely introduction to market, several key objectives must be pursued in a parallel fashion and must adhere to stringent timelines. The essence of this is the simultaneous development of (1) 65 nm process-technology (including continual process development geared towards minimization of variability) (2) highly accurate compact models and (3) product- design.
  • Keywords
    CMOS integrated circuits; integrated circuit design; microprocessor chips; CMOS-technology development; early product engineering; full-volume manufacturing; games processors; microprocessor chips; product design; product parallel design; size 65 nm; CMOS technology; Design methodology; Design optimization; Iterative methods; Microprocessors; Process design; Research and development; Semiconductor device manufacture; Time to market; Virtual manufacturing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Advanced Semiconductor Manufacturing Conference, 2007. ASMC 2007. IEEE/SEMI
  • Conference_Location
    Stresa
  • Print_ISBN
    1-4244-0652-8
  • Electronic_ISBN
    1-4244-0653-6
  • Type

    conf

  • DOI
    10.1109/ASMC.2007.375097
  • Filename
    4259263