• DocumentCode
    2923396
  • Title

    Zero Defects Quality and Reliability Challenges for Growing Markets

  • Author

    Dakshinamoorthy, S.

  • Author_Institution
    Vice President, Quality
  • fYear
    2008
  • fDate
    12-16 Oct. 2008
  • Firstpage
    1
  • Lastpage
    35
  • Keywords
    Automotive engineering; Cellular networks; Chemical analysis; Design for testability; Lead compounds; Semiconductor device reliability; Semiconductor device testing; Six sigma; Timing; Trademarks;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Integrated Reliability Workshop Final Report, 2008. IRW 2008. IEEE International
  • Conference_Location
    South lake Tahoe, CA, USA
  • ISSN
    1930-8841
  • Print_ISBN
    978-1-4244-2194-7
  • Electronic_ISBN
    1930-8841
  • Type

    conf

  • DOI
    10.1109/IRWS.2008.4796144
  • Filename
    4796144
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2923396