Circuit Failure Prediction for Robust System Design

Author

Mitra, Subhasish

Author_Institution

Robust Systems Group, Departments of Electrical Eng. & Computer Sc., Stanford University. Email: subh@stanford.edu

fYear

2008

fDate

12-16 Oct. 2008

Firstpage

Lastpage

Keywords

Aging; Built-in self-test; Circuits; Clocks; Delay effects; Error correction; Robust control; Robustness; Sensor systems; Temperature sensors;

fLanguage

English

Publisher

ieee

Conference_Titel

Integrated Reliability Workshop Final Report, 2008. IRW 2008. IEEE International

Conference_Location

South lake Tahoe, CA, USA

ISSN

1930-8841

Print_ISBN

978-1-4244-2194-7

Electronic_ISBN

1930-8841

Type

DOI

10.1109/IRWS.2008.4796145

Filename

4796145

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