Title :
JEDEC - Tutorial; Everything you wanted to know But were afraid to ask
Author_Institution :
Chair of JEDEC 14.2
Keywords :
IEC standards; Logic testing; Microelectronics; Plastic packaging; Proposals; Read-write memory; Solid state circuits; Standards development; Standards publication; Tutorial;
Conference_Titel :
Integrated Reliability Workshop Final Report, 2008. IRW 2008. IEEE International
Conference_Location :
South lake Tahoe, CA, USA
Print_ISBN :
978-1-4244-2194-7
Electronic_ISBN :
1930-8841
DOI :
10.1109/IRWS.2008.4796150
