DocumentCode
2923866
Title
Proceedings. 16th IEEE VLSI Test Symposium (Cat. No.98TB100231)
fYear
1998
fDate
30-30 April 1998
Abstract
The two-and-a-half-day technical program includes 62 paper presentations, four panels and four embedded tutorials. The paper sessions span many of the key areas in testing, such as BIST, Analog/Mixed-Signal Test, Current Test, On-Line Test, Validation/Verification, Scan and Boundary-Scan, Memory Test, Delay Test and ATPG. Also on the program are sessions on emerging areas that are gaining prominence, such as Testing Deep Submicron Circuits, Defect Level Test, Testing High Speed Circuits, Very Low Voltage Test, and Core based System-On-Chip Test
Keywords
VLSI; integrated circuit testing; ATPG; BIST; VLSI testing; analog testing; boundary scan testing; core testing; current testing; deep submicron circuit testing; defect level testing; delay testing; high speed circuit testing; memory testing; mixed-signal testing; on-line testing; scan testing; system-on-chip testing; validation; verification; very low voltage testing;
fLanguage
English
Publisher
ieee
Conference_Titel
VLSI Test Symposium, 1998. Proceedings. 16th IEEE
Conference_Location
Monterey, CA, USA
ISSN
1093-0167
Print_ISBN
0-8186-8436-4
Type
conf
DOI
10.1109/VTEST.1998.671406
Filename
671406
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