DocumentCode :
2924262
Title :
Photothermal absorption measurements in optical materials
Author :
Alexandrovski, A.L. ; Fejer, M.M. ; Route, R.P. ; Byer, Robert L.
Author_Institution :
Ginzton Lab., Stanford Univ., CA, USA
fYear :
2000
fDate :
7-12 May 2000
Firstpage :
320
Lastpage :
321
Abstract :
Summary form only given. Photo-thermal common-path interferometry, referred to as PCI, has been used to study low absorption phenomena in optical materials with the goal of understanding their behavior under high average power laser illumination. This study included the measurement of low levels of optical absorption in commercially important linear and nonlinear optical materials. The behavior of these materials under high intensity illumination was found to be quite complex, with many showing not only a wide scatter in optical absorption, but also different types of photo-chromic nonlinear behavior that depend on power, time, sample history, etc. Representative data are summarized.
Keywords :
light interferometry; nonlinear optics; optical materials; optical variables measurement; photochromism; photothermal effects; commercially important optical materials; high average power laser illumination; high intensity illumination; linear optical materials; low absorption phenomena; nonlinear optical materials; optical absorption; optical materials; photo-chromic nonlinear behavior; photo-thermal common-path interferometry; photothermal absorption measurements; power; representative data; sample history; time; Absorption; Fiber nonlinear optics; Indium tin oxide; Nonlinear optics; Optical materials; Optical mixing; Optical pumping; Optical sensors; Phase measurement; Reflectivity;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Lasers and Electro-Optics, 2000. (CLEO 2000). Conference on
Conference_Location :
San Francisco, CA, USA
Print_ISBN :
1-55752-634-6
Type :
conf
DOI :
10.1109/CLEO.2000.907064
Filename :
907064
Link To Document :
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