Title :
P4-17: Recent advances on electrical contact resistance: Theory and experiment
Author :
Zhang, Peng ; Gomez, Matthew R. ; French, David M. ; Tang, Wilkin ; Lau, Yue Ying ; Gilgenbach, Ronald M.
Author_Institution :
Dept. of Nucl. Eng. & Radiol. Sci., Univ. of Michigan, Ann Arbor, MI, USA
Abstract :
This paper discusses recent advances on the electrical contact resistance. The basic theory of the contact resistance is vastly extended to higher dimensions, including dissimilar materials in the main current channels and in the connecting bridge joining them. Recent experiments and simulations were also performed to validate our theory.
Keywords :
contact resistance; electrical contacts; dissimilar materials; electrical contact resistance; Bridge circuits; Circuit simulation; Conducting materials; Contact resistance; Electric resistance; Joining materials; Joining processes; Rough surfaces; Surface resistance; Surface roughness; Contact resistance; dissimilar materials; higher dimensions;
Conference_Titel :
Vacuum Electronics Conference (IVEC), 2010 IEEE International
Conference_Location :
Monterey, CA
Print_ISBN :
978-1-4244-7098-3
DOI :
10.1109/IVELEC.2010.5503466
