Title :
The discretized Mie-formalism for electromagnetic scattering on nonspherical particles
Author :
Rother, T. ; Schmidt, K.
Author_Institution :
Remote Sensing Ground Station Neustrelitz, German Aerosp. Res. Establ., Germany
Abstract :
Based on the method of lines (MoL) we present a new scattering algorithm which is capable to overcome the difficulties of the EBCM code. The MoL is a mathematical tool for solving partial differential equations and has been applied to the analysis of passive microwave and integrated optics structures. Our approach has a strong similarity to the well known Mie-formalism, for this reason we call it the discretized Mie-formalism (DMF). Having nonspherical, axisymmetric particles in mind, the solution of the non-separable Helmholtz equation is the main step in the DMF and is outlined in detail. For simplicity, we restrict the treatment to the case of nose-on incidence.<>
Keywords :
Helmholtz equations; electromagnetic wave scattering; partial differential equations; discretized Mie-formalism; electromagnetic scattering; method of lines; non-separable Helmholtz equation; nonspherical axisymmetric particles; nonspherical particles; nose-on incidence; partial differential equations; scattering algorithm; Convergence; Electromagnetic scattering; Ellipsoids; Finite element methods; Geometry; Integral equations; Mie scattering; Optical scattering; Particle scattering; Scattering parameters;
Conference_Titel :
Antennas and Propagation Society International Symposium, 1994. AP-S. Digest
Conference_Location :
Seattle, WA, USA
Print_ISBN :
0-7803-2009-3
DOI :
10.1109/APS.1994.407996
