• DocumentCode
    292767
  • Title

    Bit error probability degradation due to wideband RFI in receiver with 1-bit analog-to-digital converter at front end

  • Author

    Kwon, Hyuck M.

  • Author_Institution
    Lockheed Engineering & Sciences Co., Houston, TX, USA
  • Volume
    2
  • fYear
    1993
  • fDate
    11-14 Oct 1993
  • Firstpage
    629
  • Abstract
    Many modern receivers employ an intermediate frequency (IF) sampling and a 1-b analog-to-digital (A/D) converter at the receiver front end. After the 1-b A/D converter, synchronizations and bit detection are implemented digitally with the use of an application-specific integrated circuit. The author assumes that perfect PN code, carrier, and bit synchronizations are acquired before an in-band PN spread radio frequency interference (RFI) hits the link. He then considers the RFI effects on the bit error probability of the receiver with the IF sampling and the 1-b A/D converter at the front end
  • Keywords
    analogue-digital conversion; application specific integrated circuits; error statistics; military communication; pseudonoise codes; radiofrequency interference; signal sampling; spread spectrum communication; superheterodyne receivers; synchronisation; 1-bit analog-to-digital converter; IF sampling; PN code synchronisation; application-specific integrated circuit; bit error probability; bit synchronisation; carrier synchronisation; radio frequency interference; receiver front end; wideband RFI; Analog-digital conversion; Application specific integrated circuits; Degradation; Error probability; Frequency conversion; Frequency synchronization; Radiofrequency interference; Receivers; Sampling methods; Wideband;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Military Communications Conference, 1993. MILCOM '93. Conference record. Communications on the Move., IEEE
  • Conference_Location
    Boston, MA
  • Print_ISBN
    0-7803-0953-7
  • Type

    conf

  • DOI
    10.1109/MILCOM.1993.408592
  • Filename
    408592