• DocumentCode
    2928258
  • Title

    Repetitive transient aging, the influence of repetition frequency

  • Author

    Koltunowicz, Tomasz Lech ; Kochetov, Roman ; Bajracharya, Gautam ; Djairam, Dhiradj ; Smit, Johan J.

  • Author_Institution
    High Voltage Technol. & Manage., Delft Univ. of Technol., Delft, Netherlands
  • fYear
    2011
  • fDate
    5-8 June 2011
  • Firstpage
    444
  • Lastpage
    448
  • Abstract
    Power electronic devices are required in the modern grid in order to make a “bridge” between the DC and AC waveforms. These power inverters perform fast switching operations thanks to IGBTs and create fast repeating transients that are injected to the next HV component in line, e.g. a transformer. The transients are characterized by three main parameters: high repetition rates, fast slew rates and high magnitudes. This contribution presents the findings related to the repetition frequency. It was observed that the dielectric quality and lifetime decrease considerably when the frequency is changed from 1 kHz to 10 kHz. For this purpose, an experimental waveform is presented in this paper together with a broad explanation of the various phenomena that occur in the paper impregnated insulation.
  • Keywords
    impregnated insulation; insulated gate bipolar transistors; invertors; paper; power electronics; power grids; power system transients; AC waveform; DC waveform; IGBT; dielectric lifetime; dielectric quality; frequency 1 kHz to 10 kHz; paper impregnated insulation; power electronic device; power grid; power inverter; repetition frequency; repetitive transient aging; slew rate; transformer; Aging; Electric breakdown; Insulation; Inverters; Switches; Time frequency analysis; Transient analysis; Paper Impregnated Insulation; Power Inverters; Repetition Frequency; Repetitive Transients;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electrical Insulation Conference (EIC), 2011
  • Conference_Location
    Annapolis, MD
  • ISSN
    pending
  • Print_ISBN
    978-1-4577-0278-5
  • Electronic_ISBN
    pending
  • Type

    conf

  • DOI
    10.1109/EIC.2011.5996195
  • Filename
    5996195