Title :
VAMP: a hierarchical framework for design for manufacturability
Author :
Malowany, Morie E. ; Roberts, Gordon W. ; Agarwal, Vinod K.
Author_Institution :
Dept. of Electr. Eng., McGill Univ., Montreal, Que., Canada
fDate :
30 May-2 Jun 1994
Abstract :
VAMP (Variation Analysis with Matching Program) considers the impact on system-level performance caused by device-level parameter variations and mismatch effects using hierarchical behavioral modelling and statistical circuit simulation. It targets cases for which complete transistor simulation is not feasible. Hierarchy is used to decrease model dimensionality and reduce the intensive simulation requirements. Approximation of distributions at an intermediate level is the key to making the link between the detailed device level and the abstract system level tractable, both in terms of clarity and of computing load
Keywords :
Monte Carlo methods; analogue integrated circuits; circuit analysis computing; design for manufacture; integrated circuit design; statistical analysis; variational techniques; VAMP; abstract system level; computing load; design for manufacturability; device-level parameter variations; hierarchical behavioral modelling; hierarchical framework; intensive simulation requirements; intermediate level approximation; mismatch effects; model dimensionality; statistical circuit simulation; system-level performance; variation analysis; Cause effect analysis; Circuit analysis computing; Circuit simulation; Computational modeling; Computer aided manufacturing; Filters; Histograms; Mathematical model; Microelectronics; Virtual manufacturing;
Conference_Titel :
Circuits and Systems, 1994. ISCAS '94., 1994 IEEE International Symposium on
Conference_Location :
London
Print_ISBN :
0-7803-1915-X
DOI :
10.1109/ISCAS.1994.408775
