IC variability minimization using a new Cp and Cpk based variability/performance measure

A new performance measure, based on the capability indices C_p and C_pk (commonly used in process control), is proposed for general circuit Design for Quality. It overcomes some of the critical limitations of the traditional quadratic loss function (e.g., that of Taguchi) and leads to the creation of a new methodology for statistical circuit design. It also allows for the automation of the manual two-stage variability minimization/tuning methodology, and gives a concrete interpretation to the “goodness” of a circuit in easy to understand terms. Successful IC variability/performance optimization examples are presented