Title :
Detecting hard faults with combined approximate forward/backward symbolic techniques
Author :
Cabodi, Gianpiero ; Camurati, Paolo ; Quer, Stefano
Author_Institution :
Dipartimento di Autom. e Inf., Politecnico di Torino, Italy
fDate :
30 May-2 Jun 1994
Abstract :
Symbolic state space exploration techniques proved to be useful not only in formal verification and synthesis, but also in testing. Most of them are based on exact forward or backward traversal. As an alternative, approximate forward traversal algorithms have been proposed, but they are not immediately applicable to test pattern generation. This paper presents strategies for approximate forward traversal, then it combines approximate forward traversal and backward traversal for generating test patterns for hard to detect faults. Efficient search space pruning is obtained by means of cofactoring. Experimental results show that the speed up ranges from 2 to more than 50
Keywords :
automatic testing; logic testing; state-space methods; symbolic substitution; ATPG; approximate forward/backward symbolic techniques; cofactoring; hard faults detection; search space pruning; symbolic state space exploration techniques; test pattern generation; testing; Automata; Automatic test pattern generation; Automatic testing; Circuit faults; Fault detection; Formal verification; Redundancy; Space exploration; State-space methods; Test pattern generators;
Conference_Titel :
Circuits and Systems, 1994. ISCAS '94., 1994 IEEE International Symposium on
Conference_Location :
London
Print_ISBN :
0-7803-1915-X
DOI :
10.1109/ISCAS.1994.408814