DocumentCode :
2929671
Title :
Computer-aided analysis and improvement of an 8 to 18 GHz YIG-tuned FET oscillator
Author :
van der Weide, D.W.
Author_Institution :
Watkins-Johnson Co., Palo Alto, CA, USA
fYear :
1992
fDate :
1-5 June 1992
Firstpage :
881
Abstract :
Enhancing the performance of a wideband yttrium-aluminium-garnet (YIG) oscillator requires a comprehensive model of the circuit so that simulation accurately reflects its behavior in the laboratory. The authors have developed a comprehensive model of a production YIG sphere oscillator using both commonly available CAD tools and specialized measurement fixtures to enhance the accuracy of the circuit simulation. Because of this accuracy, they have achieved very close agreement between simulated and actual results over the broad tuning bandwidth of the circuit. Measured data were used for the YIG sphere resonator and coupling loop combination, obtained with a Wiltron 360 network analyzer and a specially modified 3680 K microstrip test fixture. This fixture was also used to measure and evaluate passive networks such as spiral inductors for bias and feedback elements in a new oscillator topology.<>
Keywords :
circuit analysis computing; electronic equipment testing; microwave measurement; microwave oscillators; nonlinear network analysis; solid-state microwave circuits; tuning; variable-frequency oscillators; yttrium compounds; 3680 K microstrip test fixture; 8 to 18 GHz; CAD tools; SHF; YFe5O12; YIG sphere oscillator; YIG-tuned FET oscillator; broad tuning bandwidth; circuit simulation; coupling loop; harmonic balance; resonator; wideband; Bandwidth; Circuit optimization; Circuit simulation; Computational modeling; Computer aided analysis; Fixtures; Oscillators; Production; Wideband; Yttrium;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Microwave Symposium Digest, 1992., IEEE MTT-S International
Conference_Location :
Albuquerque, NM, USA
ISSN :
0149-645X
Print_ISBN :
0-7803-0611-2
Type :
conf
DOI :
10.1109/MWSYM.1992.188129
Filename :
188129
Link To Document :
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