Title :
A Semi-empirical Model of Test Quality in Symmetric Testing: Application to Testing Java Card APIs
Author :
Gotlieb, Arnaud ; Bernard, Patrick
Author_Institution :
IRISA-INRIA, Rennes
Abstract :
In the smart card quality assurance field, software testing is the privileged way of increasing the confidence level in the implementation correctness. When testing Java Card application programming interfaces (APIs), the tester has to deal with the classical oracle problem, i.e. to find a way to evaluate the correctness of the computed output. In this paper, we report on an experience in testing methods of the Oberthur Card Systems Cosmo 32 RSA Java Card APIs by using the Symmetric Testing paradigm. This paradigm exploits user-defined symmetry properties of Java methods as test oracles. We propose an experimental environment that combines random testing and symmetry checking for (on-card) cross testing of several API methods. We develop a semi-empirical model (a model fed by experimental data) to help deciding when to stop testing and to assess test quality
Keywords :
Java; application program interfaces; program testing; program verification; security of data; smart cards; software quality; Cosmo 32 RSA Java Card API; Java Card API testing; Oberthur Card Systems; application programming interface; oracle problem; quality assurance; random testing; smart card; software correctness; software testing; symmetric testing; symmetry checking; test quality; Application software; Automatic testing; Electronic equipment testing; Formal verification; Java; Quality assurance; Smart cards; Software testing; Statistical analysis; System testing;
Conference_Titel :
Quality Software, 2006. QSIC 2006. Sixth International Conference on
Conference_Location :
Beijing
Print_ISBN :
0-7695-2718-3
DOI :
10.1109/QSIC.2006.6