Title :
Optical path length measurement using frequency-chirped laser pulses and an optical Doppler frequency sensor
Author :
Wang, Chua-Chin ; Jin, J. ; Khurgin, J. ; Trivedi, Soham ; Temple, D. ; Hommerich, U. ; Gad, Emad
Author_Institution :
Brimrose Corp. of America, Baltimore, MD, USA
Abstract :
Summary form only given. Coherent frequency domain reflectometry (CFDR) uses a light source whose frequency is linearly chirped in time and encodes target distance information onto the optical frequency domain. Continuous-wave lasers are typically used in CFDR systems as the light source and the linear-chirping in laser frequency can be achieved by using external-cavity acousto-optical frequency shifters or intra-cavity frequency tuning elements. We have demonstrated a new kind of optical displacement measurement apparatus by incorporating a novel optical Doppler frequency sensor into coherent frequency domain reflectometry systems. This new approach allows precise determination of optical beat note frequencies within a duration only fractions of the period of the optical beat notes. This enables the adoption of light sources with significantly higher frequency chirp rates and leads to improved spatial resolution of optical path length measurements.
Keywords :
Doppler measurement; chirp modulation; displacement measurement; light sources; measurement by laser beam; optical modulation; optical resolving power; optical sensors; optical variables measurement; reflectometry; chirp rates; coherent frequency domain reflectometry; coherent frequency domain reflectometry systems; continuous-wave lasers; external-cavity acousto-optical frequency shifters; frequency-chirped laser pulses; intra-cavity frequency tuning elements; laser frequency; light source; light sources; linear-chirping; linearly chirped frequency; optical Doppler frequency sensor; optical beat note frequencies; optical beat notes; optical displacement measurement apparatus; optical frequency domain; optical path length measurement; optical path length measurements; precise determination; spatial resolution; target distance information; Chirp; Displacement measurement; Frequency domain analysis; Laser tuning; Length measurement; Light sources; Optical sensors; Optical tuning; Reflectometry; Sensor systems;
Conference_Titel :
Lasers and Electro-Optics, 2000. (CLEO 2000). Conference on
Conference_Location :
San Francisco, CA, USA
Print_ISBN :
1-55752-634-6
DOI :
10.1109/CLEO.2000.907403