DocumentCode
2931179
Title
A Lie group based spatiogram similarity measure
Author
Gong, Liyu ; Wang, Tianjiang ; Liu, Fang ; Chen, Gang
Author_Institution
Intell. & Distrib. Comput. Lab., Huazhong Univ. of Sci. & Technol., Wuhan, China
fYear
2009
fDate
June 28 2009-July 3 2009
Firstpage
582
Lastpage
585
Abstract
Spatiograms were generalization of histograms, which can harvest spatial information of images. The similarity measure is important when applying spatiograms to various computer vision problems such as tracking and image retrieval. The original proposed measures use Mahalanobis distance of coordinate mean to measure spatial information in spatiograms. However, spatial information which is described by spatiograms does not lie on vector space. Measures for vector space such as Mahalanobis distance are not effective measures for them. In this paper, We model spatial information as Gaussian approximation of coordinate distributions. Then we parameterize them as a Lie group. Based on Lie group theory, we analyze function space structure of Gaussian pdfs (probability density function) and propose an effective spatiogram similarity measure. We test our measure in object tracking scenarios. Experiments show better tracking results compared with previously proposed measures.
Keywords
Gaussian distribution; Lie groups; computer vision; image retrieval; object detection; tracking; Gaussian approximation; Gaussian probability density function; Lie group; Mahalanobis distance; computer vision; coordinate distributions; function space structure; histograms; image retrieval; object tracking; similarity measure; spatial information; spatiograms; tracking; vector space; Coordinate measuring machines; Extraterrestrial measurements; Gaussian approximation; Histograms; Image retrieval; Level measurement; Pixel; Probability density function; Space technology; Testing; Lie group; Spatiogram; distance measure; feature descriptor; similarity measure;
fLanguage
English
Publisher
ieee
Conference_Titel
Multimedia and Expo, 2009. ICME 2009. IEEE International Conference on
Conference_Location
New York, NY
ISSN
1945-7871
Print_ISBN
978-1-4244-4290-4
Electronic_ISBN
1945-7871
Type
conf
DOI
10.1109/ICME.2009.5202563
Filename
5202563
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