DocumentCode
2932003
Title
A novel morphology-based classifier for automatic detection of epileptic seizures
Author
Yadav, Rajeev ; Agarwal, R. ; Swamy, M.N.S.
Author_Institution
Dept. of Electr. & Comput. Eng., Concordia Univ., Montreal, QC, Canada
fYear
2010
fDate
Aug. 31 2010-Sept. 4 2010
Firstpage
5545
Lastpage
5548
Abstract
Most of the automatic seizure detection schemes reported in the literature are complex for detecting seizures that are of (a) short duration, (b) minimal amplitude evolution, or (c) non-rhythmic mixed frequency epileptic activity. We present a novel morphology-based classifier to detect epileptic seizures for intracranial EEG recording. The method characterizes epileptic seizure by detecting continual presence of sharp half-waves in the EEG. Performance is evaluated on single channel intracranial EEG of seven patients, and compared to two previously developed methods for intracranial EEG recordings by our research group. The method detects seizure of varying types (rhythmic, non-rhythmic, short- and long- seizures) with a sensitivity of 100%, a false detection rate of 0.1/h and an average onset delay of 9.1 s. The method outperforms the two previously developed methods and is computationally simple for real-time application. Preliminary results on seven patients data are very promising.
Keywords
diseases; electroencephalography; mathematical morphology; medical signal detection; medical signal processing; signal classification; automatic epileptic seizure detection; intracranial EEG; minimal amplitude evolution; morphology-based classifier; nonrhythmic mixed frequency epileptic activity; short duration epileptic activity; Brain modeling; Delay; Electroencephalography; Feature extraction; Filtering; Monitoring; Sensitivity; Automatic seizure detection; EEG; epilepsy; Algorithms; Automation; Epilepsy; Humans;
fLanguage
English
Publisher
ieee
Conference_Titel
Engineering in Medicine and Biology Society (EMBC), 2010 Annual International Conference of the IEEE
Conference_Location
Buenos Aires
ISSN
1557-170X
Print_ISBN
978-1-4244-4123-5
Type
conf
DOI
10.1109/IEMBS.2010.5626781
Filename
5626781
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