• DocumentCode
    2932203
  • Title

    Autonomous refresh of floating body cell (FBC)

  • Author

    Ohsawa, Takashi ; Fukuda, Ryo ; Higashi, Tomoki ; Fujita, Katsuyuki ; Matsuoka, Fumiyoshi ; Shino, Tomoaki ; Furuhashi, Hironobu ; Minami, Yoshihiro ; Nakajima, Hiroomi ; Hamamoto, Takeshi ; Watanabe, Yohji ; Nitayama, Akihiro ; Furuyama, Tohru

  • Author_Institution
    Center for Semicond. R&D, Toshiba Corp., Yokohama
  • fYear
    2008
  • fDate
    15-17 Dec. 2008
  • Firstpage
    1
  • Lastpage
    4
  • Abstract
    Physics of autonomous refresh of FBC is presented. Current input to the floating body by impact ionization and output by charge pumping can balance to make FBC refresh by itself without sense amplifier operation. Thanks to this feature, multiple cells on a BL can be refreshed simultaneously, leading to a drastic reduction of BL charging current compared to the conventional refresh. 600 muA refresh current for 1 G-bit memory is achieved in 32 nm technology node with 4 ms retention time. If gate direct tunneling current is used as output, FBC can realize static RAM without periodical refresh when retaining data.
  • Keywords
    impact ionisation; random-access storage; charge pumping; floating body cell; gate direct tunneling current; impact ionization; memory; static RAM; Charge pumps; Degradation; Design engineering; Impact ionization; Interface states; Intrusion detection; Operational amplifiers; Physics; Random access memory; Tunneling;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electron Devices Meeting, 2008. IEDM 2008. IEEE International
  • Conference_Location
    San Francisco, CA
  • ISSN
    8164-2284
  • Print_ISBN
    978-1-4244-2377-4
  • Electronic_ISBN
    8164-2284
  • Type

    conf

  • DOI
    10.1109/IEDM.2008.4796819
  • Filename
    4796819