Title :
On the issues of oscillation test methodology
Author_Institution :
Dept. of Electron. & Inf. Eng., Hong Kong Polytech. Univ., Kowloon, Hong Kong
Abstract :
In recent years, advances in integration fabrication technologies prompted IC designers to move more analog circuitry onto what had been entirely digital chips, making the verification problem for the full chip more difficult. This paper presents a detailed case study of the testing of an active low pass filter using the oscillation test methodology. We highlight some of the difficulties and shortcomings of this testing approach
Keywords :
active filters; integrated circuit testing; low-pass filters; mixed analogue-digital integrated circuits; IC design; active low pass filter; full chip; mixed-signal ICs; oscillation test methodology; verification problem; CMOS process; Circuit faults; Circuit simulation; Circuit testing; Frequency response; Low pass filters; Operational amplifiers; Ring oscillators; SPICE; Virtual colonoscopy;
Conference_Titel :
Instrumentation and Measurement Technology Conference, 1999. IMTC/99. Proceedings of the 16th IEEE
Conference_Location :
Venice
Print_ISBN :
0-7803-5276-9
DOI :
10.1109/IMTC.1999.776040
