DocumentCode :
2932663
Title :
Ultra-wide band, high-repetition rate single channel mobile diagnostic system
Author :
Voss, D.E. ; Miner, L.M.
Author_Institution :
Phillips Lab., Kirtland AFB, NM, USA
fYear :
1992
fDate :
1-5 June 1992
Firstpage :
1609
Abstract :
The problem of diagnosing transient electromagnetic signals with ultrawideband, multioctave spectra extending into the microwave region occurs in a number of areas, including lightning phenomena, electrostatic discharge testing, laser and pulsed-power research, and electronic effects testing. Although these phenomena can sometimes be diagnosed by standard single-shot means, they often occur at repetition rates in the kilohertz range and higher, and determining waveform time and frequency-domain shot-to-shot reproducibility is often of major importance to the researcher. A novel single-channel diagnostic system, the System Verification Apparatus (SVA), is described. It is capable of measuring 100-ps risetime signals on a single-shot basis, while simultaneously measuring pulse-to-pulse variation. The SVA is a fully integrated system which includes a broadband sensor, signal and trigger conditioning electronics, multiple parallel digitizers with deep local storage, a fiber-optic data link to the controlling computer, and automated software for accurately reconstructing, archiving, and analyzing waveforms.<>
Keywords :
automatic test equipment; electric variables measurement; microwave measurement; transients; 100 ps; ATE; System Verification Apparatus; automated software; broadband sensor; fiber-optic data link; high-repetition rate; integrated system; microwave region; multioctave spectra; multiple parallel digitizers; single channel mobile diagnostic system; transient electromagnetic signals; trigger conditioning electronics; ultrawideband; waveform analysis; Electromagnetic transients; Electronic equipment testing; Electrostatic discharge; Lightning; Masers; Optical pulses; Pulse measurements; Reproducibility of results; Sensor systems; Ultra wideband technology;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Microwave Symposium Digest, 1992., IEEE MTT-S International
Conference_Location :
Albuquerque, NM, USA
ISSN :
0149-645X
Print_ISBN :
0-7803-0611-2
Type :
conf
DOI :
10.1109/MWSYM.1992.188327
Filename :
188327
Link To Document :
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