DocumentCode :
2932798
Title :
On strain and scattering in deeply-scaled n-channel MOSFETs: A quantum-corrected semiclassical Monte Carlo analysis
Author :
Shi, Ningyu ; Register, Leonard F. ; Banerjee, Sanjay K.
Author_Institution :
Dept. of Electr. & Comput. Eng., Univ. of Texas at Austin, Austin, TX
fYear :
2008
fDate :
15-17 Dec. 2008
Firstpage :
1
Lastpage :
4
Abstract :
A model of valley-dependent quantum-confinement-enhanced scattering for electrons has added to the existing quantum corrections in our full band Monte Carlo simulator, Monte Carlo of the University of Texas (MCUT). The simulator was then calibrated to fit channel mobility curves, both strained and unstrained, by adjusting surface roughness parameters. After testing different strain & surface orientation combinations, we find that, in order, uniaxial tensile [110] and biaxial tensile (001) strain with [110] channel orientations in each case represent the optimal scenarios for electron transport. A decreasing advantage of strain with down-scaling is exhibited. Significantly, we find unexpected benefits and limitations of strain, as well as limitations on the use of mobility or even thermal velocity for predicting these effects.
Keywords :
MOSFET; Monte Carlo methods; electron transport theory; surface roughness; channel mobility curves; deeply-scaled n-channel MOSFET; electron transport; quantum-corrected semiclassical Monte Carlo analysis; surface roughness parameters; valley-dependent quantum-confinement- enhanced scattering; Capacitive sensors; Electrons; MOSFETs; Monte Carlo methods; Particle scattering; Rough surfaces; Surface fitting; Surface roughness; Tensile strain; Uniaxial strain;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electron Devices Meeting, 2008. IEDM 2008. IEEE International
Conference_Location :
San Francisco, CA
ISSN :
8164-2284
Print_ISBN :
978-1-4244-2377-4
Electronic_ISBN :
8164-2284
Type :
conf
DOI :
10.1109/IEDM.2008.4796846
Filename :
4796846
Link To Document :
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