• DocumentCode
    2933486
  • Title

    Low-cost electrochemical impedance spectroscopy system for corrosion monitoring of metallic antiquities and works of art

  • Author

    Carullo, A. ; Ferraris, F. ; Parvis, M. ; Vallan, A. ; Angelini, E. ; Spinelli, P.

  • Author_Institution
    Dipt. di Elettronica, Politecnico di Torino, Italy
  • Volume
    3
  • fYear
    1999
  • fDate
    1999
  • Firstpage
    1680
  • Abstract
    Electrochemical impedance spectroscopy (EIS) is recognised to be a powerful and non-invasive technique to test the integrity of protective coatings on memorials, but commercial EIS systems are rather costly though versatile devices. This paper describes a low cost and portable EIS system that is based on a compact DSP board. Such an EIS system employs a front end, which is based on a transimdedance amplifiers, and embeds the potentiostatic functions so that the EIS system can be used without requiring an external potentiostat. The software that runs on the DSP is designed to analyse the electrochemical impedance only in a reduced frequency range in order to produce a simple “corrosion alert” result. The device is equipped with a digital interface and can be connected to a portable personal computer to carry out a complete frequency analysis and perform a more complex data processing
  • Keywords
    art; corrosion protective coatings; corrosion testing; electric impedance measurement; electrochemical analysis; portable instruments; DSP board; antiquity; corrosion monitoring; data processing; digital interface; electrochemical impedance spectroscopy; frequency analysis; memorial; metallic artifact; noninvasive technique; portable EIS system; potentiostatic function; protective coating; transimdedance amplifier; work of art; Coatings; Costs; Data processing; Digital signal processing; Electrochemical impedance spectroscopy; Frequency; Microcomputers; Performance analysis; Power system protection; System testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Instrumentation and Measurement Technology Conference, 1999. IMTC/99. Proceedings of the 16th IEEE
  • Conference_Location
    Venice
  • ISSN
    1091-5281
  • Print_ISBN
    0-7803-5276-9
  • Type

    conf

  • DOI
    10.1109/IMTC.1999.776109
  • Filename
    776109