Development of an erbium-fiber-laser-based optical frequency comb at NTSC

Author

Yanyan Zhang ; Lulu Yan ; Songtao Fan ; Long Zhang ; Wenyu Zhao ; Wenge Guo ; Shougang Zhang ; Haifeng Jiang

Author_Institution

Key Lab. of Time & Freq. Primary Stand., Nat. Time Service Center, Xi´an, China

fYear

2015

fDate

12-16 April 2015

Firstpage

599

Lastpage

601

Abstract

We report the research progress of an erbium-fiber-based optical frequency comb with repetition rate 232 MHz. Its repetition rate is stabilized to a continuous wave laser via an intra-cavity electro-optic modulator and a piezo-transducer, yielding an in-loop frequency instability about 2.1×10^-16 @ 1s. The carrier envelope offset (CEO) frequency with a signal-to-noise ratio of 45 dB for 300 kHz resolution spectrum is detected by using a common path f-2f interferometer. CEO frequency is locked to a RF reference frequency by controlling the pump current. The frequency instability induced by in-loop CEO frequency is about 2.9×10^-16@ 1s. The frequency count in use is a Π-type counter from K&K.

Keywords

electro-optical modulation; erbium; fibre lasers; fibre optic sensors; frequency measurement; laser frequency stability; light interferometers; optical frequency combs; optical pumping; optical variables measurement; piezo-optical effects; piezoelectric transducers; Π-type counter; CEO; Er; NTSC; carrier envelope offset; common path f-2f interferometer; continuous wave laser; erbium fiber laser; frequency 232 MHz; frequency 300 kHz; in-loop frequency instability; intracavity electrooptic modulator; noise figure 45 dB; optical frequency comb; piezotransducer; pump current control; signal-to-noise ratio; time 1 s; Fiber nonlinear optics; Frequency measurement; Optical fibers; Optical pumping; Ultrafast optics; Fiber laser; Frequency instability; Frequency stabilization; Optical frequency comb;

fLanguage

English

Publisher

ieee

Conference_Titel

Frequency Control Symposium & the European Frequency and Time Forum (FCS), 2015 Joint Conference of the IEEE International

Conference_Location

Denver, CO

Print_ISBN

978-1-4799-8865-5

Type

conf

DOI

10.1109/FCS.2015.7138916

Filename

7138916