Microwave photoconductivity spectrometer

Author

Longhai, Kuang ; Bo, Kuang

fYear

1996

fDate

12-15 Aug 1996

Firstpage

302

Lastpage

306

Abstract

A new non-contact measuring technique, which uses a microwave field as the medium, is described. A new kind of microwave photoconductivity spectrometer has been developed, and is used for observing and measuring the photoconductive effect of AgCl, AgBr, CdS, etc. The advantage of this technique is that many characteristics of semiconductors, especially photoconductors can be studied rapidly and accurately. Also real time observation of conductivity variation is possible

Keywords

II-VI semiconductors; cadmium compounds; electrical conductivity measurement; high-frequency effects; microwave measurement; microwave spectrometers; photoconductivity; semiconductor materials; silver compounds; AgBr; AgCl; CdS; conductivity variation; microwave field; microwave photoconductivity spectrometer; noncontact measuring technique; photoconductive effect; photoconductors; real time observation; semiconductors; Conductivity; Dielectric constant; Magnetic field measurement; Magnetic resonance; Microwave measurements; Microwave theory and techniques; Photoconducting devices; Photoconductivity; Resonant frequency; Spectroscopy;

fLanguage

English

Publisher

ieee

Conference_Titel

Millimeter Wave and Far Infrared Science and Technology, 1996. Proceedings., 4TH International Conference on

Conference_Location

Beijing

Print_ISBN

0-7803-3619-4

Type

conf

DOI

10.1109/ICMWFT.1996.574882

Filename

574882