• DocumentCode
    2935792
  • Title

    Using reconfigurable FPGAs in test equipment applications

  • Author

    Fawcett, Bradly K.

  • Author_Institution
    Xilinx Inc., San Jose, CA, USA
  • fYear
    1994
  • fDate
    27-29 Sep 1994
  • Firstpage
    562
  • Lastpage
    567
  • Abstract
    Since their introduction in 1985, Field Programmable Gate Array (FPGA) devices have been used in tens of thousands of designs. In most of these, logic implemented in an FPGA could have been implemented with more traditional logic devices-masked gate arrays, or MSI/SSI devices, for example. However, FPGAs were a better alternative for any number of reasons-no nonrecurring engineering costs, lower design risks, less power dissipation, faster design and production cycles, etc. In essence, FPGAs combine the high-integration benefits of gate arrays with the time-to-market benefits of a user-programmable device, and typically are selected over other logic technologies to gain these benefits
  • Keywords
    field programmable gate arrays; logic design; random-access storage; reconfigurable architectures; test equipment; design cycles; design risks; high-integration benefits; logic technologies; nonrecurring engineering costs; power dissipation; production cycles; reconfigurable FPGAs; test equipment applications; time-to-market benefits; user-programmable device; Costs; Design engineering; Field programmable gate arrays; Logic arrays; Logic devices; Logic gates; Power engineering and energy; Programmable logic arrays; Reconfigurable logic; Test equipment;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    WESCON/94. Idea/Microelectronics. Conference Record
  • Conference_Location
    Anaheim , CA
  • ISSN
    1095-791X
  • Print_ISBN
    0-7803-9992-7
  • Type

    conf

  • DOI
    10.1109/WESCON.1994.403536
  • Filename
    403536