• DocumentCode
    2937490
  • Title

    Quantitative characterization of underfill/substrate interfacial toughness enhancement by silane additives

  • Author

    Yao, Qizhou ; Qu, Jianmin ; Wu, Jiali ; Wong, C.P.

  • Author_Institution
    George W. Woodruff Sch. of Mech. Eng., Georgia Inst. of Technol., Atlanta, GA, USA
  • fYear
    1999
  • fDate
    1999
  • Firstpage
    1079
  • Lastpage
    1082
  • Abstract
    The apparent fracture toughness of the interfaces between epoxy-based underfill materials and various substrates is experimentally measured. A small amount of silane coupling agents is added to the base underfill to form various underfill derivatives. Double layer specimens with preexisting interfacial cracks are made for four-point bending tests. The substrates tested include aluminum, polyimide, BCB, and printed wiring boards (FR-4) with solder mask. The measurements are qualitatively correlated to each silane additive. Although the purpose of adding silane additives was to enhance the adhesion, it is found that the enhancement of interfacial toughness depends on the type of substrate. The results of this study have important implications in flip-chip reliability where interfacial cracking is one of the major failure modes
  • Keywords
    bending; cracks; encapsulation; failure analysis; flip-chip devices; fracture toughness testing; integrated circuit reliability; BCB; double layer specimens; epoxy-based underfill; failure modes; flip-chip reliability; four-point bending tests; fracture toughness; polyimide; preexisting interfacial cracks; printed wiring boards; silane coupling agents; solder mask; underfill/substrate interfacial toughness enhancement; Additives; Adhesives; Chemicals; Delamination; Fatigue; Flip chip; Lead; Pollution measurement; Stress; Testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic Components and Technology Conference, 1999. 1999 Proceedings. 49th
  • Conference_Location
    San Diego, CA
  • ISSN
    0569-5503
  • Print_ISBN
    0-7803-5231-9
  • Type

    conf

  • DOI
    10.1109/ECTC.1999.776323
  • Filename
    776323