Title :
Performance of the SLD central drift chamber
Author :
Hildreth, M.D. ; Junk, T.R. ; Markiewicz, T.W. ; Masuda, H. ; Neal, H.A. ; Prescott, C.Y. ; Rochester, L.S. ; Usher, T. ; Fero, M.J. ; Williams, D.C. ; Venuti, J. ; Mours, B. ; Takahashi, T. ; Sugiyama, A. ; Shypit, R. ; Honma, A.
Author_Institution :
Stanford Linear Accel. Center, Stanford Univ., CA, USA
fDate :
30 Oct-5 Nov 1994
Abstract :
We report for the first time on the performance of the SLD central drift chamber (CDC) at SLC, which has been recording data since 1992. The low mass of the chamber and the use of a slow, cool gas help to maximize the drift distance resolution. We describe some of the calibrations and corrections applied to the data, and report on the resolutions achieved thus far. We measure an intrinsic drift resolution of 55-110 μm in the region of uniform field. Analysis of the full drift-pulse waveform allows for efficient double-hit resolution of about 1 mm. Momentum resolution is characterized by the formula dpt/pt2=√(0.00502+(0.010/pt )2). Used in conjunction with the SLD CCD-based vertex detector, the CDC permits measurements of impact parameters of di-muon events to the level of 10 μm in the r-φ plane and 36 μm in the r-z plane. Even though the chamber is not optimized for particle identification, a resolution of 6% is achieved in the measurement of dE/dx in wide-angle Bhabha events
Keywords :
calibration; drift chambers; CDC; SLD CCD-based vertex detector; SLD central drift chamber; calibration; chamber mass; di-muon events; drift distance resolution; efficient double-hit resolution; full drift-pulse waveform; impact parameters; intrinsic drift resolution; momentum resolution; particle identification; r-φ plane; r-z plane; slow cool gas; uniform field; wide-angle Bhabha events; Aluminum; CD recording; Calibration; Detectors; Linear accelerators; Magnetic field measurement; Particle tracking; Structural beams; Superluminescent diodes; Wires;
Conference_Titel :
Nuclear Science Symposium and Medical Imaging Conference, 1994., 1994 IEEE Conference Record
Conference_Location :
Norfolk, VA
Print_ISBN :
0-7803-2544-3
DOI :
10.1109/NSSMIC.1994.474367
