Title :
Robust outlier detection in high-density surface electromyographic signals
Author :
Marateb, H.R. ; Rojas-Martinez, M. ; Villanueva, M. A Mañanas ; Merletti, R.
Author_Institution :
Dipt. di Elettron., Politencnico di Torino, Torino, Italy
fDate :
Aug. 31 2010-Sept. 4 2010
Abstract :
High Density surface Electromyography (HDsEMG) has been applied in both research and clinical applications for non-invasive neuromuscular assessment in several different fields using 2-D array. Proper interpretation of HDsEMG signals requires identifying “good” channels (where there is no short-circuit or bad-contact or major power line interference problem). Recording with many channels usually implies bad-contacts (that introduces large power line interference) and short-circuits (when using gels). In addition to online monitoring the electrode-contact quality, it is necessary to identify “bad” channels, or outliers, prior to the analysis of HDsEMG signal. In this paper we introduce a robust method to identify outliers in a set of monopolar HDsEMG signals recorded from Biceps and Triceps Brachii, Anconeus, Brachioradialis and Pronator Teres. The sensitivity and precision of this method show that this approach is promising.
Keywords :
data analysis; electromyography; medical signal processing; pattern recognition; 2D array; Anconeus; Brachioradialis; Pronator Teres; Triceps Brachii; biceps; electrode-contact quality; high density surface electromyographic signals; monopolar HDsEMG signals; noninvasive neuromuscular assessment; online monitoring; pattern recognition; power line interference problem; robust outlier detection; short-circuits; Arrays; Electromyography; Feature extraction; Muscles; Robustness; Sensitivity; Tuning; Algorithms; Artifacts; Diagnosis, Computer-Assisted; Electromyography; Humans; Muscle Contraction; Muscle, Skeletal; Pattern Recognition, Automated; Reproducibility of Results; Sensitivity and Specificity;
Conference_Titel :
Engineering in Medicine and Biology Society (EMBC), 2010 Annual International Conference of the IEEE
Conference_Location :
Buenos Aires
Print_ISBN :
978-1-4244-4123-5
DOI :
10.1109/IEMBS.2010.5627280