Title :
Microwave electromagnetic properties of FeNi alloy particles composites doping with FeCuNbSiB nanocrystalline microwires
Author :
Han, M. ; Liang, D. ; Yan, B. ; Xie, J. ; Chen, L. ; Deng, L.
Author_Institution :
Univ. of Electron. Sci. & Technol. of China, Chengdu
Abstract :
FeCuNbSiB amorphous microwires with average diameter about 40 mum were fabricated by a specially designed melted quench facility. Anneal treatment at T=673K for 1 hour had been carried out for amorphous wires to obtain nanocrystalline grains with average grain diameter of 34 nm. Then, the heat treated microwires were cut into short fibers, the length and diameter ratio was about 2. The composite samples for the permittivity and permeability measurements on a vector network analyzer (Agilent E8363A) were fabricated with FeNi magnetic particles, epoxy resin and FeCuNbSiB microwires. Both the dielectric loss and the magnetic loss spectrums show that FeCuNbSiB nanocrystalline microwires can be effectively used to tailor the performance of microwave absorption for the FeNi magnetic particles -epoxy resin composite EM absorber.
Keywords :
amorphous magnetic materials; annealing; boron alloys; copper alloys; dielectric losses; doping profiles; eddy current losses; electromagnetic wave absorption; filled polymers; iron alloys; magnetic leakage; magnetic microwave devices; magnetic particles; magnetic permeability; microwave materials; nanocomposites; nanoparticles; nanowires; nickel alloys; niobium alloys; permittivity; silver alloys; soft magnetic materials; Agilent E8363A; FeCuNbSiB:FeNi; amorphous microwires; anneal treatment; composite samples; dielectric loss spectrum; epoxy resin; magnetic loss spectrum; magnetic particles; microwave electromagnetic properties; nanocrystalline soft magnetic material; permeability; permittivity; temperature 673 K; vector network analyzer; Amorphous materials; Annealing; Dielectric losses; Doping; Electromagnetic heating; Magnetic losses; Magnetic particles; Permeability measurement; Permittivity; Wires;
Conference_Titel :
Magnetics Conference, 2006. INTERMAG 2006. IEEE International
Conference_Location :
San Diego, CA
Print_ISBN :
1-4244-1479-2
DOI :
10.1109/INTMAG.2006.376239
