Title :
High-Density PCB Inspection and System with Multi SV-GMR Sensor Eddy-Current Testing Probe
Author :
Chomsuwan, K. ; Koggalage, R. ; Yamada, S. ; Iwahara, M. ; Wakiwaka, H. ; Shoji, S.
Author_Institution :
Kanazawa Univ., Ishikawa
Abstract :
In this paper, high-density PCB inspection and its system based on ECT technique are discussed.
Keywords :
eddy current testing; giant magnetoresistance; magnetic sensors; printed circuit testing; probes; ECT technique; eddy-current testing probe; high-density PCB inspection; multi SV-GMR sensor; Amplifiers; Conductors; Electrical capacitance tomography; Frequency; Inspection; Probes; Sensor arrays; Sensor systems; Signal analysis; System testing;
Conference_Titel :
Magnetics Conference, 2006. INTERMAG 2006. IEEE International
Conference_Location :
San Diego, CA
Print_ISBN :
1-4244-1479-2
DOI :
10.1109/INTMAG.2006.376247