Title :
A remote controlled automated measurement system
Author :
Alegria, Francisco ; Ramos, Helena G.
Author_Institution :
Centro de Electrotecnia Teorica e Medidas Electricas, Tech. Univ. Lisbon, Portugal
Abstract :
Control of instrumentation systems through network PC´s is increasingly important nowadays, both in the industry and in R&D centers. This paper presents an automated measurement system used to characterise a semiconductor device. The system can be controlled by any of the PC´s integrated in a LAN network using a client/server communication. The server controls the instrumentation through an IEEE-488 interface bus
Keywords :
automatic test equipment; client-server systems; computerised control; computerised instrumentation; local area networks; microcomputer applications; semiconductor device testing; telecontrol; IEEE-488 interface bus; LAN network; R&D centers; automated measurement; client/server communication; industry; network PC; remote controlled automated measurement system; semiconductor device; Automatic control; Communication system control; Control systems; Electrical equipment industry; Industrial control; Instruments; Local area networks; Network servers; Semiconductor device measurement; Semiconductor devices;
Conference_Titel :
Instrumentation and Measurement Technology Conference, 1997. IMTC/97. Proceedings. Sensing, Processing, Networking., IEEE
Conference_Location :
Ottawa, Ont.
Print_ISBN :
0-7803-3747-6
DOI :
10.1109/IMTC.1997.612387
