• DocumentCode
    2942874
  • Title

    Quantifying distortion of RF power amplifiers for estimation of predistorter performance

  • Author

    Draxler, Paul J. ; Zhu, Anding ; Yan, Jonmei J. ; Kolinko, Pavel ; Kimball, Donald F. ; Asbeck, Peter M.

  • Author_Institution
    Qualcomm Inc., 5775 Morehouse Dr., San Diego, CA, USA
  • fYear
    2008
  • fDate
    15-20 June 2008
  • Firstpage
    931
  • Lastpage
    934
  • Abstract
    This paper demonstrates a method to quantify the accuracy of memory models and the effectiveness of digital predistortion of power amplifiers with memory. By using assumptions of periodic stationarity, coherent ensemble averaging and a stable measurement system, we are able to decompose the waveform distortion into memoryless, deterministic memory, and random memory contributions. We demonstrate how this can be used to evaluate the performance of a power amplifier and project its optimal performance with predistortion. We also show experimentally that the dynamic deviation reduction-based Volterra series digital predistortion technique has convergent behavior, moving towards these quantified targets when applied to a class AB power amplifier implemented with GaN FETs.
  • Keywords
    III-V semiconductors; Volterra series; distortion measurement; gallium compounds; power amplifiers; radiofrequency amplifiers; wide band gap semiconductors; GaN; GaN FETs; RF power amplifiers; convergent behavior; predistorter performance; random memory contributions; reduction-based Volterra series digital predistortion; Distortion measurement; Educational institutions; FETs; Gallium nitride; Linearization techniques; Power amplifiers; Power system modeling; Predistortion; Radio frequency; Radiofrequency amplifiers; Behavioral modeling; Volterra series; linearization; power amplifier; predistorter;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microwave Symposium Digest, 2008 IEEE MTT-S International
  • Conference_Location
    Atlanta, GA
  • ISSN
    0149-645X
  • Print_ISBN
    978-1-4244-1780-3
  • Electronic_ISBN
    0149-645X
  • Type

    conf

  • DOI
    10.1109/MWSYM.2008.4632986
  • Filename
    4632986