Title :
Nonlinear feature extraction using kernel principal component analysis with non-negative pre-image
Author :
Kallas, Maya ; Honeine, Paul ; Richard, Cédric ; Amoud, Hassan ; Francis, Clovis
fDate :
Aug. 31 2010-Sept. 4 2010
Abstract :
The inherent physical characteristics of many real-life phenomena, including biological and physiological aspects, require adapted nonlinear tools. Moreover, the additive nature in some situations involve solutions expressed as positive combinations of data. In this paper, we propose a nonlinear feature extraction method, with a non-negativity constraint. To this end, the kernel principal component analysis is considered to define the most relevant features in the reproducing kernel Hilbert space. These features are the nonlinear principal components with high-order correlations between input variables. A pre-image technique is required to get back to the input space. With a non-negative constraint, we show that one can solve the pre-image problem efficiently, using a simple iterative scheme. Furthermore, the constrained solution contributes to the stability of the algorithm. Experimental results on event-related potentials (ERP) illustrate the efficiency of the proposed method.
Keywords :
Hilbert spaces; electroencephalography; feature extraction; iterative methods; medical signal processing; principal component analysis; EEG; ERP; event-related potentials; iterative scheme; kernel Hilbert space; kernel principal component analysis; nonlinear feature extraction; pre-image technique; Brain models; Electroencephalography; Feature extraction; Kernel; Optimization; Principal component analysis; Kernel-PCA; additive weight algorithm; constraint; non-negativity; pre-image problem; Brain; Brain Mapping; Diagnosis, Computer-Assisted; Electroencephalography; Evoked Potentials; Humans; Nonlinear Dynamics; Pattern Recognition, Automated; Principal Component Analysis; Reproducibility of Results; Sensitivity and Specificity;
Conference_Titel :
Engineering in Medicine and Biology Society (EMBC), 2010 Annual International Conference of the IEEE
Conference_Location :
Buenos Aires
Print_ISBN :
978-1-4244-4123-5
DOI :
10.1109/IEMBS.2010.5627421