DocumentCode :
2944498
Title :
Quantitative simulation of strained and unstrained InP-based resonant tunneling diodes
Author :
Klimeck, G. ; Boykin, T.B. ; Bowen, R.C. ; Lake, R. ; Blanks, D. ; Moise, T. ; Yung-Chung Kao ; Frensley, W.R.
Author_Institution :
Texas Instrum. Inc., Dallas, TX, USA
fYear :
1997
fDate :
23-25 June 1997
Firstpage :
92
Lastpage :
93
Abstract :
State-of-the-art InP-based resonant tunneling diodes (RTDs) are being developed for circuit applications such as low power memory cells and high speed adders. Depending on the application RTDs must be designed to provide either a low or a high current density. Quantitative modeling of such devices is expected to reduce the device development cycle time significantly. We have expanded our interactive design and analysis software NEMO (Nanoelectronic Modeling) to quantitatively model pseudomorphic InP-based RTDs which can include lattice matched In/sub 0.53/Ga/sub 0.47/As, In/sub 0.52/Al/sub 0.48/As, and pseudomorphic AlAs and InAs. We present the world´s first quantitative simulations of strained and unstrained InP-based RTDs that include quantum charge self-consistency (Hartree) in a full band (sp/sup 3/s*) model.
Keywords :
III-V semiconductors; indium compounds; resonant tunnelling diodes; semiconductor device models; AlAs; In/sub 0.52/Al/sub 0.48/As; In/sub 0.53/Ga/sub 0.47/As; InAs; InP; NEMO; Nanoelectronic Modeling; current density; device development cycle time; full band model; interactive design and analysis software; lattice matched layer; pseudomorphic layer; quantitative simulation; quantum charge; resonant tunneling diode; self-consistency Hartree theory; strain; Current density; Design engineering; Diodes; Indium gallium arsenide; Lakes; Power engineering and energy; Resonant tunneling devices; System testing; Temperature; Thermionic emission;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Device Research Conference Digest, 1997. 5th
Conference_Location :
Fort Collins, CO, USA
Print_ISBN :
0-7803-3911-8
Type :
conf
DOI :
10.1109/DRC.1997.612487
Filename :
612487
Link To Document :
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