Title :
High-speed operation of a resonant tunneling flip-flop circuit employing a MOBILE (monostable-bistable transition logic element)
Author :
Maezawa, K. ; Matsuzaki, H. ; Arai, K. ; Otsuji, T. ; Yamamoto, M.
Author_Institution :
NTT Syst. Electron. Lab., Kanagawa, Japan
Abstract :
Resonant tunneling (RT) devices attract much attention because of their potential for high-speed operation as well as their high functionality, which leads to lower power dissipation. We have developed a highly functional logic gate, called MOBILE (monostable-bistable transition logic element), which exploits the negative differential resistance (NDR) of the RT phenomenon. In this paper, we demonstrate the high-speed operation-up to 18 Gb/s-of the MOBILE flip-flop (FF) circuit at room temperature. The present result indicates the promise of MOBILE-based FF circuits for high-speed digital applications.
Keywords :
active networks; flip-flops; negative resistance devices; resonant tunnelling devices; 18 Gbit/s; MOBILE; high-speed operation; monostable-bistable transition logic element; negative differential resistance; resonant tunneling flip-flop circuit; Bit rate; Circuit testing; Clocks; Electron devices; Flip-flops; HEMTs; Logic devices; RLC circuits; Resonant tunneling devices; Voltage;
Conference_Titel :
Device Research Conference Digest, 1997. 5th
Conference_Location :
Fort Collins, CO, USA
Print_ISBN :
0-7803-3911-8
DOI :
10.1109/DRC.1997.612488