DocumentCode
2944600
Title
Study of SET devices for metrological applications at 0.4 K
Author
Lapointe, J.
Author_Institution
Inst. for Nat. Meas. Stand., Nat. Res. Council of Canada, Ottawa, Ont., Canada
fYear
1998
fDate
6-10 July 1998
Firstpage
213
Lastpage
214
Abstract
Single electron effects have been observed in devices measured at temperatures as low as 0.4 K. The charge noise was measured in electrometers and evidence of background charge fluctuations was observed. Custom-made micro-coax cables have also been fabricated and their measured attenuation is found to increase with the 3/4´th power of frequency, in contrast to the 1/2 power dependence expected from the theory.
Keywords
charge measurement; coaxial cables; cryogenic electronics; electrometers; quantum interference devices; tunnelling; 0.4 K; SET device; attenuation; background charge fluctuations; charge noise; cryogenic metrology; electrometer; micro-coax cable; power law; single electron tunneling; Attenuation measurement; Background noise; Cables; Charge measurement; Current measurement; Electrons; Fluctuations; Noise measurement; Power measurement; Temperature measurement;
fLanguage
English
Publisher
ieee
Conference_Titel
Precision Electromagnetic Measurements Digest, 1998 Conference on
Conference_Location
Washington, DC, USA
Print_ISBN
0-7803-5018-9
Type
conf
DOI
10.1109/CPEM.1998.699873
Filename
699873
Link To Document