• DocumentCode
    2944693
  • Title

    On the cyclostationary properties of the 1/f noise of microwave semiconductor devices

  • Author

    De Souza, A. A Lisboa ; Nallatamby, J.C. ; Prigent, M. ; Obregon, J.

  • Author_Institution
    XLIM - Dep. C2S2 - Université de Limoges 7, Rue Jules Valles, Brive - 19100 - France
  • fYear
    2008
  • fDate
    15-20 June 2008
  • Firstpage
    1569
  • Lastpage
    1572
  • Abstract
    This paper addresses, from an experimental perspective, the long-standing question on whether the 1/f noise of microwave semiconductor devices should be considered cyclostationary in compact models. By using a simple instrumentation setup and basic mixer concepts, it will be shown that the external equivalent current noise sources of such devices simply cannot be stationary. To demonstrate our ideas, a through experimental analysis was carried out on purely-resistive bridge circuits made up of microwave varactors and transistors under large-signal operation whose DC current component is kept constant. When computing the voltage noise power of specific circuit arrangements, errors in excess of 2 0dB may be induced if the stationary concept is adopted. The difference between the stationary or cyclostationary concepts will be simulated with the aid of the simulator ADS from Agilent.
  • Keywords
    1/f noise; bridge circuits; microwave transistors; semiconductor devices; varactors; 1/f noise; Agilent; cyclostationary properties; microwave semiconductor devices; microwave transistors; microwave varactors; purely-resistive bridge circuits; simulator ADS; Bridge circuits; Circuit noise; Circuit simulation; Computational modeling; Instruments; Microwave devices; Microwave transistors; Semiconductor device noise; Semiconductor devices; Varactors; Noise measurement; Nonlinear circuits; Semiconductor device modeling;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microwave Symposium Digest, 2008 IEEE MTT-S International
  • Conference_Location
    Atlanta, GA
  • ISSN
    0149-645X
  • Print_ISBN
    978-1-4244-1780-3
  • Electronic_ISBN
    0149-645X
  • Type

    conf

  • DOI
    10.1109/MWSYM.2008.4633082
  • Filename
    4633082