DocumentCode
2944837
Title
Gated diamond field emitter array with ultra low operating voltage and high emission current
Author
Wisitsora-at, A. ; Kang, W.P. ; Davidson, J.L. ; Howell, M. ; Li, Q. ; Xu, J.F. ; Kerns, D.V.
Author_Institution
Dept. of Electr. & Comput. Eng., Vanderbilt Univ., Nashville, TN, USA
fYear
1997
fDate
23-25 June 1997
Firstpage
150
Lastpage
151
Abstract
Gated Diamond Field Emitter Array with ultra low operating voltage and high emission current has been reported for the first time. Two types of built-in gated diamond field emitter have been successfully fabricated: a volcano gated structure by self-align technique and a cap gated structure by electrostatic bonding. Diamond was deposited by PECVD on a silicon inverted pyramidal mold. The mold was then etched away. To construct the gated volcano emitter, a 2 /spl mu/m-thick SiO and a 1 /spl mu/m-thick Al were deposited on the diamond tips. Self-align technique was then performed to obtain the gated volcano structure with SiO as a gate dielectric and Al as a gate. To construct the cap gated emitter, an anode comprised of heavily doped silicon was electrostatically bonded to the substrate with a SiO/sub 2/ dielectric spacer between, forming an emitter-anode spacing of 2 /spl mu/m.
Keywords
diamond; electron field emission; vacuum microelectronics; Al gate; C; PECVD; SiO gate dielectric; SiO/sub 2/ dielectric spacer; cap gated structure; electrostatic bonding; emission current; gated diamond field emitter array; self-align technique; silicon inverted pyramidal mold; ultralow operating voltage; volcano gated structure; Anodes; Artificial intelligence; Bonding; Dielectric substrates; Electrostatics; Etching; Field emitter arrays; Low voltage; Silicon; Volcanoes;
fLanguage
English
Publisher
ieee
Conference_Titel
Device Research Conference Digest, 1997. 5th
Conference_Location
Fort Collins, CO, USA
Print_ISBN
0-7803-3911-8
Type
conf
DOI
10.1109/DRC.1997.612507
Filename
612507
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