Title :
Perpendicular Media Overcoat Coverage Challenge
Author :
Dai, Q. ; Takano, K. ; Wang, G. ; Brinkman, E. ; Waltman, R. ; Nayak, V. ; Yen, B.K.
Author_Institution :
Hitachi GST, San Jose
Abstract :
The perpendicular media investigated employed silicon oxide in the recording layer to facilitate grain segregation, as reported. Overcoat used for these studies includes sputtered CNx, SiNx and ion beam carbon. Method for corrosion assessment includes (1) ICP-MS measurement of extractable Co, (2) Electrochemical polarization curve, and (3) Temperature and Relative Humidity (T&RH) condensation test. Roughness-induced challenges on subsequent post processing steps is reported. Because PMR media is reported to have high surface roughness, our first study has been designed to quantify overcoat coverage limit and compare that with longitudinal media.
Keywords :
carbon compounds; corrosion; electrochemistry; grain boundary segregation; perpendicular magnetic recording; protective coatings; silicon compounds; sputtered coatings; surface roughness; SiO2; amorphous grain boundaries; corrosion; electrochemical polarization curve; overcoat coverage challenge; perpendicular recording; segregated grains; silicon oxide; surface roughness; Burnishing; Cobalt; Corrosion; Humidity; Ion beams; Perpendicular magnetic recording; Polarization; Protection; Rough surfaces; Surface roughness;
Conference_Titel :
Magnetics Conference, 2006. INTERMAG 2006. IEEE International
Conference_Location :
San Diego, CA
Print_ISBN :
1-4244-1479-2
DOI :
10.1109/INTMAG.2006.376441