DocumentCode
2946448
Title
Magnetic and Writing Properties of Clad Lines in a Toggle MRAM
Author
Shimura, K. ; Ohshima, N. ; Miura, S. ; Nebashi, R. ; Suzuki, T. ; Hada, H. ; Tahara, S. ; Aikawa, H. ; Ueda, T. ; Kajiyama, T. ; Yoda, H.
Author_Institution
NEC Corp., Sagamihara
fYear
2006
fDate
8-12 May 2006
Firstpage
733
Lastpage
733
Abstract
Savtchenko proposed a toggle MRAM in which the half-selected writing disturb phenomena is eliminated. The writing currents of the toggle MRAM were high. To reduce the current, magnetic cladding was used for both the word and bit lines. However, the structure of the clad line has not been reported yet. We investigated the relation between the magnetic properties and structures of the clad line by changing the deposition conditions. Moreover, we applied the optimized clad lines to toggle memories.
Keywords
claddings; coercive force; magnetic storage; magnetic susceptibility; random-access storage; remanence; clad lines; half-selected writing disturb phenomena; magnetic cladding; magnetic properties; toggle MRAM; writing currents; writing properties; Crystallization; Extraterrestrial measurements; Laboratories; Magnetic films; Magnetic hysteresis; Magnetic properties; Magnetic susceptibility; National electric code; Remanence; Writing;
fLanguage
English
Publisher
ieee
Conference_Titel
Magnetics Conference, 2006. INTERMAG 2006. IEEE International
Conference_Location
San Diego, CA
Print_ISBN
1-4244-1479-2
Type
conf
DOI
10.1109/INTMAG.2006.376457
Filename
4262166
Link To Document