• DocumentCode
    2946448
  • Title

    Magnetic and Writing Properties of Clad Lines in a Toggle MRAM

  • Author

    Shimura, K. ; Ohshima, N. ; Miura, S. ; Nebashi, R. ; Suzuki, T. ; Hada, H. ; Tahara, S. ; Aikawa, H. ; Ueda, T. ; Kajiyama, T. ; Yoda, H.

  • Author_Institution
    NEC Corp., Sagamihara
  • fYear
    2006
  • fDate
    8-12 May 2006
  • Firstpage
    733
  • Lastpage
    733
  • Abstract
    Savtchenko proposed a toggle MRAM in which the half-selected writing disturb phenomena is eliminated. The writing currents of the toggle MRAM were high. To reduce the current, magnetic cladding was used for both the word and bit lines. However, the structure of the clad line has not been reported yet. We investigated the relation between the magnetic properties and structures of the clad line by changing the deposition conditions. Moreover, we applied the optimized clad lines to toggle memories.
  • Keywords
    claddings; coercive force; magnetic storage; magnetic susceptibility; random-access storage; remanence; clad lines; half-selected writing disturb phenomena; magnetic cladding; magnetic properties; toggle MRAM; writing currents; writing properties; Crystallization; Extraterrestrial measurements; Laboratories; Magnetic films; Magnetic hysteresis; Magnetic properties; Magnetic susceptibility; National electric code; Remanence; Writing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Magnetics Conference, 2006. INTERMAG 2006. IEEE International
  • Conference_Location
    San Diego, CA
  • Print_ISBN
    1-4244-1479-2
  • Type

    conf

  • DOI
    10.1109/INTMAG.2006.376457
  • Filename
    4262166