• DocumentCode
    294650
  • Title

    Acoustic measurements of the vocal-tract area function: sensitivity analysis and experiments

  • Author

    Yehia, Hani ; Honda, Masaaki ; Itakura, Funitada

  • Author_Institution
    Sch. of Eng., Nagoya Univ., Japan
  • Volume
    1
  • fYear
    1995
  • fDate
    9-12 May 1995
  • Firstpage
    652
  • Abstract
    A method used to determine the vocal-tract cross-sectional area function from acoustical measurements at the lips is analyzed. Under the framework described by Sondhi and Gopinath (1971) and implemented by Sondhi and Resnick (1983), a sensitivity analysis of the vocal-tract area function, derived from the impedance or reflectance at the lips is performed. It indicates that, in the ideal case, the area function is not heavily affected by random distortions of the impulse response at the lips. Simulations and real measurements show that the method works relatively well, except for regions behind narrow constrictions. In this case, an excitation pulse with high energy, as well as a fine sampling, proved to be important. The excitation used is a time stretched pulse. It produces an excitation with high energy without the necessity of a high power sound generator device
  • Keywords
    acoustic impedance; acoustic signal processing; acoustic variables measurement; sensitivity analysis; signal sampling; speech processing; transient response; acoustic measurements; experiments; fine sampling; high energy excitation pulse; impedance; impulse response; lips; narrow constrictions; random distortions; reflectance; sensitivity analysis; simulations; speech production; time stretched pulse; vocal-tract area function; Acoustic distortion; Acoustic measurements; Area measurement; Distortion measurement; Impedance; Lips; Power generation; Reflectivity; Sampling methods; Sensitivity analysis;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Acoustics, Speech, and Signal Processing, 1995. ICASSP-95., 1995 International Conference on
  • Conference_Location
    Detroit, MI
  • ISSN
    1520-6149
  • Print_ISBN
    0-7803-2431-5
  • Type

    conf

  • DOI
    10.1109/ICASSP.1995.479682
  • Filename
    479682