Title :
Magnetic Properties of TbFeCo Amorphous Films Deposited on Patterned Underlayer
Author :
Rahman, M. ; Liu, X. ; Morisako, A.
Author_Institution :
Shinshu Univ., Nagano
Abstract :
In this study, TbFeCo with the composition satisfying high saturation magnetization and low coercivity has been selected then the coercivity and magnetization reversal mechanism has been manipulated by using patterned underlayer. At first 50 nm Al films have been deposited on glass substrate then anodization has been carried out at different voltage to have different surface morphology. Tb18Fe70Co12 films with thickness of 20 nm have been deposited on this patterned anodized aluminum. Magnetic properties were measured by using vibrating sample magnetometer (VSM) the film composition was determined by electron probe micro analyzer (EPMA). The surface morphology has been studied by atomic force microscope (AFM). The AFM images of glass substrate shows almost smooth surface and that the as deposited Al surface comparatively rougher with mixture of some large and small islands.The surface roughness of as deposited Al can be improved by anodization. According to the angular dependence of coercivity, the magnetization reversal in TbFeCo films deposited on anodized alumina is dominated by Stoner-Wohlfarth rotation model. At first 50 nm Al films have been deposited on glass substrate then anodization has been carried out at different voltage to have different surface morphology. Tb18Fe70Co12 films with thickness of 20 nm have been deposited on this patterned anodized aluminum.
Keywords :
aluminium; amorphous magnetic materials; anodisation; atomic force microscopy; cobalt alloys; coercive force; electron probe analysis; glass; iron alloys; magnetic thin films; magnetisation reversal; magnetometers; surface morphology; surface roughness; terbium alloys; Al; Stoner-Wohlfarth rotation model; TbFeCo; amorphous films; anodization; atomic force microscope; coercivity; electron probe micro analyzer; glass substrate; magnetic properties; magnetization; magnetization reversal mechanism; patterned underlayer; size 20 nm; size 50 nm; surface morphology; surface roughness; vibrating sample magnetometer; Amorphous materials; Coercive force; Glass; Magnetic films; Magnetic properties; Magnetization reversal; Rough surfaces; Substrates; Surface morphology; Surface roughness;
Conference_Titel :
Magnetics Conference, 2006. INTERMAG 2006. IEEE International
Conference_Location :
San Diego, CA
Print_ISBN :
1-4244-1479-2
DOI :
10.1109/INTMAG.2006.376486