Title :
Generation and characterization of intense ultrashort tunable far-infrared (30-250 /spl mu/m) laser pulses
Author :
Yan, X. ; MacLeod, A.M. ; Gillespie, W.A. ; Knippels, G.M.H. ; Oepts, D. ; van der Meer, A.F.G.
Author_Institution :
Sch. of Sci. & Eng., Abertay Dundee Univ., Dundee, Scotland, UK
Abstract :
Summary form only. Intense rapidly tunable picosecond laser pulses have been generated in the far-infrared from 30-250 /spl mu/m, a range that is not well covered by other sources. The transform-limited, diffraction-limited laser pulses have energies of up to 17 /spl mu/J, peak powers of more than 1 MW, a length of only 18 periods of the optical field, and focused intensities of 0.1 GW/cm/sup 2/. Measurements of both the optical field amplitude and phase have been performed at 150 /spl mu/m with a rapid-scanning cross-correlation technique probing the field-induced birefringence in a ZnTe crystal with a 10-femtosecond Ti:sapphire laser. The far-infrared free-electron laser opens up the exciting possibility of performing non-linear experiments in a relatively unexplored spectral range.
Keywords :
II-VI semiconductors; birefringence; free electron lasers; infrared sources; laser variables measurement; optical correlation; optical pulse generation; submillimetre wave generation; zinc compounds; 1 MW; 10 fs; 17 muJ; 30 to 250 mum; Ti:sapphire laser; ZnTe; ZnTe crystal; diffraction-limited laser pulses; far-infrared free-electron laser; field-induced birefringence; focused intensities; intense rapidly tunable picosecond laser pulse; intense ultrashort tunable far-IR laser pulse generation; optical field amplitude; peak powers; rapid-scanning cross-correlation technique; transform-limited; Character generation; Free electron lasers; Nonlinear optics; Optical diffraction; Optical pulse generation; Optical pulses; Performance evaluation; Phase measurement; Power lasers; Tunable circuits and devices;
Conference_Titel :
Lasers and Electro-Optics Europe, 2000. Conference Digest. 2000 Conference on
Conference_Location :
Nice
Print_ISBN :
0-7803-6319-1
DOI :
10.1109/CLEOE.2000.909809