DocumentCode :
2949094
Title :
Magnetic phase contrast X-ray microscopy
Author :
Fischer, P. ; Sakdinawat, A.E. ; Chang, C. ; Anderson, E.H. ; Attwood, D.T.
Author_Institution :
Lawrence Berkeley Nat. Lab., Berkeley
fYear :
2006
fDate :
8-12 May 2006
Firstpage :
890
Lastpage :
890
Abstract :
This paper reports the use of phase sensitive X-ray optical elements in the soft X-ray transmission microscope beamline to image the magnetic domain structure of Gd25Fe75 amorphous layer at high spatial resolution. The amorphous magnetic material is deposited by electron beam evaporation onto a polyimid substrate exhibiting a pronounced perpendicular magnetic anisotropy. Observations show a magnetic contrast at the boundary of the magnetic domains; i.e. at the domain walls where the magnetization changes its direction. Hence, the availability of the X-ray optical elements adds an important new contrast mechanism to magnetic X-ray microscopy.
Keywords :
X-ray microscopy; amorphous magnetic materials; electron beam deposition; gadolinium alloys; iron alloys; magnetic domain walls; perpendicular magnetic anisotropy; Gd25Fe75; amorphous magnetic material; domain walls; electron beam evaporation; magnetic domain structure; magnetic phase contrast X-ray microscopy; magnetization; perpendicular magnetic anisotropy; phase sensitive X-ray optical elements; polyimid substrate; soft X-ray transmission microscope; Amorphous magnetic materials; Electron optics; Magnetic anisotropy; Magnetic domain walls; Magnetic domains; Magnetic force microscopy; Optical microscopy; Optical sensors; Perpendicular magnetic anisotropy; X-ray imaging;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Magnetics Conference, 2006. INTERMAG 2006. IEEE International
Conference_Location :
San Diego, CA
Print_ISBN :
1-4244-1479-2
Type :
conf
DOI :
10.1109/INTMAG.2006.374921
Filename :
4262323
Link To Document :
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