• DocumentCode
    2949591
  • Title

    Switching Current Fluctuation And Repeatability for MRAM with Propeller Shape MTJ

  • Author

    Shimomura, N. ; Yoda, H. ; Ikegawa, S. ; Kai, T. ; Amano, M. ; Aikawa, H. ; Ueda, T. ; Asao, Y. ; Hosotani, K. ; Shimizu, Y. ; Tsuchida, K.

  • Author_Institution
    Corp. Resarch & Dev. Center, Kawasaki
  • fYear
    2006
  • fDate
    8-12 May 2006
  • Firstpage
    922
  • Lastpage
    922
  • Abstract
    In this paper, a write error rate, when the function test on this magnetic tunnel junctions (MTJ) is continued repeatedly, is estimated from the write margin and switching current fluctuation. This paper also reveals how the write sequence influences these results.The switching current fluctuation is strongly dependent on the turn-on sequence, which is related to the magnetization reversal mode.
  • Keywords
    current fluctuations; magnetic storage; magnetic tunnelling; magnetisation reversal; magnetoresistive devices; random-access storage; magnetization reversal; magnetoresistive random access memory; propeller shape magnetic tunnel junctions; switching current fluctuation; turn-on sequence; write error rate; write margin; Circuit testing; Error analysis; Error correction codes; Fluctuations; Magnetic tunneling; Magnetoresistance; Propellers; Random access memory; Shape; Switches;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Magnetics Conference, 2006. INTERMAG 2006. IEEE International
  • Conference_Location
    San Diego, CA
  • Print_ISBN
    1-4244-1479-2
  • Type

    conf

  • DOI
    10.1109/INTMAG.2006.374953
  • Filename
    4262355
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2949591