Title :
Automated ADC characterisation using the histogram test stimulated by Gaussian noise
Author :
Cameiro Martins, R. ; Cruz Serra, A.M.
Author_Institution :
Lab. Med. Electr., Lisbon Tech. Univ., Portugal
Abstract :
The determination of the stationary transfer function of an ADC using an automated test system and employing the histogram test using, however, Gaussian noise as the stimulus signal, is presented. This transfer function is used to derive merit figures like SNDR, THD and effective number of bits.
Keywords :
Gaussian distribution; Gaussian noise; analogue-digital conversion; automatic testing; signal sampling; transfer functions; waveform analysis; Gaussian distribution; Gaussian noise stimulated; automated ADC characterisation; automated test system; cumulative probability; effective number of bits; four-step procedure; histogram test; merit figures; minimum variance; nonlinearity vectors; stationary transfer function; statistically defined signal; stimulus signal PDF; Automatic testing; Gaussian noise; Histograms; Noise generators; Phase distortion; Probability density function; Sampling methods; System testing; Telecommunications; Transfer functions;
Conference_Titel :
Precision Electromagnetic Measurements Digest, 1998 Conference on
Conference_Location :
Washington, DC, USA
Print_ISBN :
0-7803-5018-9
DOI :
10.1109/CPEM.1998.699926
