• DocumentCode
    2950690
  • Title

    Crystallographic orientation analysis of magnetite thin films by means of electron backscatter diffraction (EBSD)

  • Author

    Koblischka-Veneva, A.D. ; Koblischka, M.R. ; Muecklich, F. ; Murphy, S. ; Zhou, Y. ; Shvets, I.V.

  • Author_Institution
    Univ. of the Saarland, Saarbrucken
  • fYear
    2006
  • fDate
    8-12 May 2006
  • Firstpage
    989
  • Lastpage
    989
  • Abstract
    Fe3O4[001] thin films is grown on MgO[001] substrates using oxygen-plasma-assisted molecular beam epitaxy and annealed in air at 250 degC. Automated EBSD scans is performed twice to study the crystallographic orientation by means of recording of Kikuchi patterns.
  • Keywords
    crystal orientation; electron diffraction; ferromagnetic materials; iron compounds; magnesium compounds; magnetic annealing; magnetic thin films; molecular beam epitaxial growth; plasma deposition; Fe3O4; Kikuchi patterns; MgO; annealing; crystallographic orientations analysis; electron backscatter diffraction; magnetite thin films; oxygen-plasma-assisted molecular beam epitaxy; temperature 250 C; Annealing; Backscatter; Crystallography; Diffraction; Electrons; Iron; Magnetic analysis; Molecular beam epitaxial growth; Substrates; Transistors;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Magnetics Conference, 2006. INTERMAG 2006. IEEE International
  • Conference_Location
    San Diego, CA
  • Print_ISBN
    1-4244-1479-2
  • Type

    conf

  • DOI
    10.1109/INTMAG.2006.375455
  • Filename
    4262422
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2950690