The Sub-Band decomposition of Fluctuated signals for the Estimation of Power Spectra

Author

Zajacek, Jiri ; Grmela, Lubomir

Author_Institution

Brno Univ. of Technol., Brno

fYear

2007

fDate

3-5 Oct. 2007

Firstpage

1

Lastpage

6

Abstract

The noise spectroscopy is used to determinate quality and reliability of semiconductor materials. We have used the means of time-frequency analysis for processing of long time duration stochastic signal. Tree-structured FIR filter bank implemented in a recursive way for octave dividing frequency band was designed as full parallel computational algorithm for power spectral density estimation. In the very low frequency area we will obtain high resolution and low level variance of PSD.

Keywords

FIR filters; reliability; time-frequency analysis; fluctuated signals; noise spectroscopy; power spectra estimation; semiconductor materials; stochastic signal; subband decomposition; time-frequency analysis; tree-structured FIR filter bank; Finite impulse response filter; Frequency estimation; Materials reliability; Semiconductor device noise; Semiconductor device reliability; Semiconductor materials; Signal processing; Spectroscopy; Stochastic resonance; Time frequency analysis; 1/f noise; FIR; octave filter bank; power spectral density (PSD); recursive algorithm;

fLanguage

English

Publisher

ieee

Conference_Titel

Intelligent Signal Processing, 2007. WISP 2007. IEEE International Symposium on

Conference_Location

Alcala de Henares

Print_ISBN

978-1-4244-0829-0

Electronic_ISBN

978-1-4244-0830-6

Type

conf

DOI

10.1109/WISP.2007.4447530

Filename

4447530