• DocumentCode
    2953161
  • Title

    A New Study on Distance Metrics as Similarity Measurement

  • Author

    Yu, Jie ; Amores, Jaume ; Sebe, Nicu ; Tian, Qi

  • Author_Institution
    Dept. of Comput. Sci., Texas Univ., San Antonio, TX
  • fYear
    2006
  • fDate
    9-12 July 2006
  • Firstpage
    533
  • Lastpage
    536
  • Abstract
    Distance metric is widely used in similarity estimation. In this paper we find that the most popular Euclidean and Manhattan distance may not be suitable for all data distributions. A general guideline to establish the relation between a distribution model and its corresponding similarity estimation is proposed. Based on maximum likelihood theory, we propose new distance metrics, such as harmonic distance and geometric distance. Because the feature elements may be from heterogeneous sources and usually have different influence on similarity estimation, it is inappropriate to model the distribution as isotropic. We propose a novel boosted distance metric that not only finds the best distance metric that fits the distribution of the underlying elements but also selects the most important feature elements with respect to similarity. The boosted distance metric is tested on fifteen benchmark data sets from the UCI repository and two image retrieval applications. In all the experiments, robust results are obtained based on the proposed methods
  • Keywords
    benchmark testing; image retrieval; maximum likelihood estimation; UCI dataset; benchmark testing; boosted distance metric; distribution model; image retrieval application; maximum likelihood theory; similarity estimation; Computer science; Content based retrieval; Euclidean distance; Feature extraction; Guidelines; Image retrieval; Information retrieval; Maximum likelihood estimation; Robustness; Testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Multimedia and Expo, 2006 IEEE International Conference on
  • Conference_Location
    Toronto, Ont.
  • Print_ISBN
    1-4244-0366-7
  • Electronic_ISBN
    1-4244-0367-7
  • Type

    conf

  • DOI
    10.1109/ICME.2006.262443
  • Filename
    4036654